Tous les livres numériques de la collection "Springer Series in Materials Science" - Springer

165 Livre(s)
Télécharger le livre : Introduction to Wave Scattering, Localization and Mesoscopic Phenomena
Introduction to Wave Scattering, Localization and Mesoscopic Phenomena
Ping Sheng , Ping Sheng

Editeur : Springer
Parution : 2006-08-25
Collection : Springer Series in Materials Science PDF

147,69 €
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Télécharger le livre : Hartree-Fock-Slater Method for Materials Science
Hartree-Fock-Slater Method for Materials Science
Hirohiko Adachi , Jun Kawai , Takeshi Mukoyama
Molecular-orbital calculations for materials design such as alloys, ceramics, and coordination compounds are now possible for experimentalists. Molecuar-orbital calculations for the interpretation of chemical effect of spectra are also possible for experimentalists. The...

Editeur : Springer
Parution : 2006-03-08
Collection : Springer Series in Materials Science PDF

147,69 €
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Télécharger le livre : Wide-Gap Chalcopyrites
Wide-Gap Chalcopyrites
Uwe Rau , Susanne Siebentritt
Chalcopyrites, in particular those with a wide band gap, are fascinating materials in terms of their technological potential in the next generation of thin-film solar cells and in terms of their basic material properties. They exhibit uniquely low defect formation...

Editeur : Springer
Parution : 2006-02-25
Collection : Springer Series in Materials Science PDF

147,69 €
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Télécharger le livre : Metallopolymer Nanocomposites
Metallopolymer Nanocomposites
V.N. Kestelman , A.D. Pomogailo
Highly dispersed nanoscale particles in polymer matrices are currently attracting great interest in many fields of chemistry, physics, and materials science. This book presents and analyzes the essential data on nanoscale metal clusters dispersed in, or chemically...

Editeur : Springer
Parution : 2006-01-27
Collection : Springer Series in Materials Science PDF

210,99 €
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Télécharger le livre : Lifetime Spectroscopy
Lifetime Spectroscopy
Stefan Rein
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor...

Editeur : Springer
Parution : 2005-11-25
Collection : Springer Series in Materials Science PDF

304,89 €
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